High Resolution Transmission and Scanning Electron Microscope
Equipment type: Electron microscopy
200 kV high-brightness X-FEG
Modes: TEM, STEM, HAAFD, DF, DPC
SuperX EDX System
(limited) Cryo TEM, STEM
TEM Holder: Double Tilt, High Tilt, Cryo
Piezo-Stage 20 pm
Ceta 16 Megapixel Digital Camera
Auto tilt series imaging
Solid state inorganic and soft matter materials (metals, semiconductors, composites, polymers etc)
2D (up to atomic resolution) and 3D imaging
2D EDX analytics (point analysis and mapping)
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