Scios 2 HiVac

Home / Scios 2 HiVac

Focused Ion Beam / Scanning Electron Microscopy

Equipment type: Electron microscopy


  • 30 kV FEG
  • Gallium-ion-column
  • SE, T1, T2 and DBS Detektors
  • C and Platin deposition
  • Tomography equipment
  • EDAX EDX System
  • Mikromanipulator
  • PraparationPreparation of TEM Lamella
  • Auto slice and view (ASNV)
  • Avizo

Application areas:
SEM imaging
FIB micro/nanostructuring
EDX analysis (point and map analysis)
FIB-SEM Tomography


Contact Specialist

Usage Fee

For a quote, access rules and usage conditions
please contact Dr. Yi Thomann

For more information please see our:
Terms of use


No documents available