Scios 2 HiVac

Focused Ion Beam / Scanning Electron Microscopy

Equipment type: Electron microscopy

Scios 2 HiVac scale 2

SPECIFICATIONS:

  • 30 kV FEG
  • Gallium-ion-column
  • SE, T1, T2 and DBS Detektors
  • C and Platin deposition
  • Tomography equipment
  • EDAX EDX System
  • Mikromanipulator
  • PraparationPreparation of TEM Lamella
  • Auto slice and view (ASNV)
  • Avizo
Application areas: SEM imaging FIB micro/nanostructuring EDX analysis (point and map analysis) FIB-SEM Tomography

Location

Contact Specialist

Usage Fee

Device-fees
For a quote, access rules and usage conditions
please contact Dr. Yi Thomann

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Documentation

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