Scios 2 HiVac

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Focused Ion Beam / Scanning Electron Microscopy

Equipment type: Electron microscopy

SPECIFICATIONS:

  • 30 kV FEG
  • Gallium-ion-column
  • SE, T1, T2 and DBS Detektors
  • C and Platin deposition
  • Tomography equipment
  • EDAX EDX System
  • Mikromanipulator
  • PraparationPreparation of TEM Lamella
  • Auto slice and view (ASNV)
  • Avizo

Application areas:
SEM imaging
FIB micro/nanostructuring
EDX analysis (point and map analysis)
FIB-SEM Tomography

Location

Contact Specialist

Usage Fee

Device-fees
For a quote, access rules and usage conditions
please contact Dr. Yi Thomann

For more information please see our:
Terms of use

Documentation

No documents available