FEG Hitachi SU8010

Scanning Electron Microscope (SEM)

Equipment type: Electron microscopy

FEG Hitachi-SU8010

SPECIFICATIONS:

  • FEG Hitachi SU8010 Scanning Electron Microscope
  • Quorum PP3010T Cryo preparation system
  • Hitachi IM4000Plus Ion Milling System

Location

Contact Specialist

Usage Fee

unknown
For a quote, access rules and usage conditions
please contact the core facility staff at ICS.

Documentation

No documents available