Talos 200X

HRTEM/HRSTEM

SPECIFICATIONS:

  • 200 kV high-brightness X-FEG
  • Modes: TEM, STEM, HAAFD, DF, DPC
  • SuperX EDX System
  • (limited) Cryo TEM, STEM
  • TEM Holder: Double Tilt, High Tilt, Cryo
  • Piezo-Stage 20 pm
  • Low-dose technique
  • Ceta 16 Megapixel Digital Camera
  • Auto tilt series imaging
  • Tomography reconstruction

Application areas:
Solid state inorganic and soft matter materials (metals, semiconductors, composites, polymers etc)
2D (up to atomic resolution) and 3D imaging
2D EDX analytics (point analysis and mapping)

 

 

 

 

Microscope Booking (E-mail)

Location:

Room: 00.016
Tel: +49 761 203-95321
Core Facility 1 "Imaging of Materials Systems"
Albert-Ludwigs University Freiburg

Contact Specialist:

Dr. Ralf Thomann
Core Facility 1 "Imaging of Materials Systems"
+49 761 203-95073
 ralf.thomann@fmf.uni-freiburg.de

Usage Fee:

Price: Device-fees
For a quote, access rules and usage conditions
please contact Dr. Yi Thomann

For more information please see our:
Terms of use