FEG Hitachi SU8010

Scanning Electron Microscope

SPECIFICATIONS:

  • FEG Hitachi SU8010 Scanning Electron Microscope

  • Quorum PP3010T Cryo preparation system

  • Hitachi IM4000Plus Ion Milling System

 

 

 

 

Location:

Contact Specialist:

Alain Carvalho
EM Core Facility - Institut Charles Sadron (ICS)
+33 3.88.41.41.19
 alain.carvalho@ics-cnrs.unistra.fr

Usage Fee:

Price: unknown
For a quote, access rules and usage conditions
please contact the core facility staff at ICS.