Equipment available at the Core Facility "Imaging of Materials Systems":
System 1: Scios 2 HiVac - Focused Ion Beam / Scanning Electron Microscopy:
Application areas:
SEM imaging
FIB micro/nanostructuring
EDX analysis (point and map analysis)
FIB-SEM Tomography
TEM lamellae preparation
System 2: Talos 200X - HRTEM/HRSTEM:
Application areas:
Solid state inorganic and soft matter materials (metals, semiconductors, composites, polymers etc).
2D (up to atomic resolution) and 3D imaging.
2D EDX analytics (point analysis and mapping).
System 3: Talos 120C - TEM :
Application areas:
TEM and Cryo TEM of soft matter samples
Cryo TEM Tomography
System 4: EM ICE with AFS 2 and AF
High Pressure Freezer with Freeze Substitution and Low Temperature Embedding System
System 5: SKYSCAN 1272 - µCT
High-resolution 3D X-ray Microscopy